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Boundary scan
Results: 183

#	Item
151	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for September 6th, [removed]AM – 10:15 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-10-01 11:53:51 Computing Technology Joint Test Action Group Standards organizations Institute of Electrical and Electronics Engineers Cron Boundary scan description language Boundary scan Electronics manufacturing Electronics IEEE standards
152	Section 13 – Scope of proposed project. The project develops Analog Boundary Scan Description Language (ABSDL), to describe the boundary scan implementation in a mixed-signal device conforming to IEEE[removed]A Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 11:21:38 Boundary scan description language Boundary scan Business Joint Test Action Group Institute of Electrical and Electronics Engineers Electronics manufacturing Technology Engineering
153	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for July 23rd, 2007 7:30 AM – 8:50 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-08-20 15:23:01 Boundary scan Electronics manufacturing Technology Joint Test Action Group
154	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for August 30th, [removed]AM – 12 PM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-10-01 11:53:56 Boundary scan description language Boundary scan Joint Test Action Group Business Institute of Electrical and Electronics Engineers Electronics manufacturing Technology Engineering
155	Analog Boundary Scan Description Language (ABSDL) Bambang Suparjo Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 17:20:20 Electronic engineering Boundary scan description language Joint Test Action Group Boundary scan Ethernet over twisted pair Electronics manufacturing Manufacturing Electronics
156	Microsoft PowerPoint - dot4_itc2010_final.pptx Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2010-10-29 13:05:00 Joint Test Action Group Electronics manufacturing Technology Boundary scan
157	Semantic Rules, ABSDL (IEEE[removed]syntax rules for BSDL apply (as defined in IEEE Std[removed]Annex B, specifically section B.8) - semantic rules for BSDL apply (as defined in IEEE Std[removed]Annex B, specificall Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 11:22:15 Boundary scan Joint Test Action Group Electronics manufacturing IEEE standards Technology
158	White Paper Test Automation of 3D Integrated Systems January 2012 Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 12:41:47 Integrated circuits Semiconductor device fabrication Through-silicon via Software testing Electronic design Automatic test pattern generation Boundary scan Automatic test equipment Synopsys Electronic engineering Electronics Technology
159	Datasheet DFTMAX High Quality, Low Cost Test Overview Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2015-03-20 14:15:36 Electronics manufacturing Electronic design Integrated circuits Automatic test pattern generation Test compression Scan chain Joint Test Action Group Boundary scan Physical design Electronic engineering Electronics Electronic design automation
160	IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING Received 30 April 2013; revised 6 October 2013; accepted 22 December[removed]Date of publication 5 February 2014; date of current version 7 May 2014. Add to Reading List Source URL: www.computer.org Language: English - Date: 2014-06-16 15:59:17 Manufacturing Joint Test Action Group Boundary scan Scan chain Test compression Automatic test pattern generation Block cipher Man-in-the-middle attack Side channel attack Electronic engineering Electronics Electronics manufacturing

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